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Hisham . Ed(S): Haddara - Characterization Methods for Submicron MOSFETs - 9781461285847 - V9781461285847
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Characterization Methods for Submicron MOSFETs

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Description for Characterization Methods for Submicron MOSFETs Paperback. Editor(s): Haddara, Hisham. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 232 pages, biography. BIC Classification: THR; TJFC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 13. Weight in Grams: 391.
It is true that the Metal-Oxide-Semiconductor Field-Eeffect Transistor (MOSFET) is a key component in modern microelectronics. It is also true that there is a lack of comprehensive books on MOSFET characterization in gen­ eral. However there is more than that as to the motivation and reasons behind writing this book. During the last decade, device physicists, researchers and engineers have been continuously faced with new elements which made the task of MOSFET characterization more and more crucial as well as difficult. The progressive miniaturization of devices has caused several phenomena to emerge and modify the performance of scaled-down MOSFETs. Localized ... Read more

Product Details

Format
Paperback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
232
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
232
Place of Publication
New York, NY, United States
ISBN
9781461285847
SKU
V9781461285847
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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