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Trace-Based Post-Silicon Validation for VLSI Circuits
Liu, Xiao; Xu, Qiang
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Description for Trace-Based Post-Silicon Validation for VLSI Circuits
Paperback. This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective. Series: Lecture Notes in Electrical Engineering. Num Pages: 123 pages, 21 black & white illustrations, 38 colour illustrations, 18 black & white tables, biograp. BIC Classification: TJFC; TJFD5; UYF. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 7. Weight in Grams: 203.
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design ... Read more
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design ... Read more
Product Details
Format
Paperback
Publication date
2016
Publisher
Springer International Publishing AG Switzerland
Number of pages
123
Condition
New
Series
Lecture Notes in Electrical Engineering
Number of Pages
108
Place of Publication
Cham, Switzerland
ISBN
9783319375946
SKU
V9783319375946
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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