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Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Jose Pineda de Gyvez
€ 118.23
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Description for Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Paperback. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 167 pages, 48 black & white illustrations, biography. BIC Classification: THR. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 11. Weight in Grams: 308.
The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept ... Read more
The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept ... Read more
Product Details
Format
Paperback
Publication date
2014
Publisher
Springer-Verlag New York Inc. United States
Number of pages
167
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
167
Place of Publication
New York, NY, United States
ISBN
9781461363835
SKU
V9781461363835
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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