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Chadradhar, S. T.; Agrawal, Vishwani D.; Bushnell, Michael L. - Neural Models and Algorithms for Digital Testing - 9781461367673 - V9781461367673
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Neural Models and Algorithms for Digital Testing

€ 118.66
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Description for Neural Models and Algorithms for Digital Testing Paperback. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 197 pages, biography. BIC Classification: THR; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 11. Weight in Grams: 320.
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . ... Read more

Product Details

Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
197
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
184
Place of Publication
New York, NY, United States
ISBN
9781461367673
SKU
V9781461367673
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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