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Krishnaswamy, Smita; Markov, Igor L.; Hayes, John P. - Design, Analysis and Test of Logic Circuits Under Uncertainty - 9789400797987 - V9789400797987
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Design, Analysis and Test of Logic Circuits Under Uncertainty

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Description for Design, Analysis and Test of Logic Circuits Under Uncertainty Paperback. Combining theory with practical examples, this volume presents a comprehensive overview of logic circuits. The text presents techniques used to analyze, design and test logic circuits with probabilistic behavior, and provides a multidisciplinary approach to uncertainty. Series: Lecture Notes in Electrical Engineering. Num Pages: 124 pages, 24 black & white tables, biography. BIC Classification: TJFC; UK; UMB; UYAM; UYD; UYF. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 7. Weight in Grams: 221.
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Product Details

Format
Paperback
Publication date
2014
Publisher
Springer Netherlands
Number of pages
124
Condition
New
Series
Lecture Notes in Electrical Engineering
Number of Pages
124
Place of Publication
Dordrecht, Netherlands
ISBN
9789400797987
SKU
V9789400797987
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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