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. Ed(S): Robles-Kelly, Antonio; Loog, Marco; Biggio, Battista; Escolano, Francisco; Wilson, Richard - Structural, Syntactic, and Statistical Pattern Recognition - 9783319490540 - V9783319490540
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Structural, Syntactic, and Statistical Pattern Recognition

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Description for Structural, Syntactic, and Statistical Pattern Recognition Paperback. Editor(s): Robles-Kelly, Antonio; Loog, Marco; Biggio, Battista; Escolano, Francisco; Wilson, Richard. Series: Lecture Notes in Computer Science. Num Pages: 601 pages, 167 black & white illustrations, biography. BIC Classification: UMB; UNF; UNH; UYQ; UYQP. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 31. Weight in Grams: 914.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. 

Product Details

Format
Paperback
Publication date
2016
Publisher
Springer International Publishing AG Switzerland
Number of pages
601
Condition
New
Series
Lecture Notes in Computer Science
Number of Pages
588
Place of Publication
Cham, Switzerland
ISBN
9783319490540
SKU
V9783319490540
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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