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Structural, Syntactic, and Statistical Pattern Recognition
. Ed(S): Caelli, Terry; Amin, Adnan; Duin, Robert P. W. (Delft University Of Technology, Delft, Netherlands); Kamel, Mohamed; Ridder, Dick de
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Description for Structural, Syntactic, and Statistical Pattern Recognition
Paperback. Constitutes the proceedings of the 9th International Workshop on Structural and Syntactic Pattern Recognition and the 4th International Workshop on Statistical Techniques in Pattern Recognition held in Canada in 2002. Editor(s): Caelli, Terry; Amin, Adnan; Duin, Robert P. W. (Delft University of Technology, Delft, Netherlands); Kamel, Mohamed; Ridder, Dick de. Series: Lecture Notes in Computer Science. Num Pages: 898 pages, biography. BIC Classification: UYQP. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 44. Weight in Grams: 1306.
Product Details
Format
Paperback
Publication date
2002
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
898
Condition
New
Series
Lecture Notes in Computer Science
ISBN
9783540440116
SKU
V9783540440116
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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