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Progress in Transmission Electron Microscopy 1: Concepts and Techniques
Xiao-Feng Zhang
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Description for Progress in Transmission Electron Microscopy 1: Concepts and Techniques
paperback. Series: Springer Series in Surface Sciences. Num Pages: 383 pages, 13 black & white tables, biography. BIC Classification: PDDM; TBN; TDCK; TGMT. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 20. Weight in Grams: 593.
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Product Details
Format
Paperback
Publication date
2010
Publisher
Springer Germany
Number of pages
383
Condition
New
Series
Springer Series in Surface Sciences
Number of Pages
367
Place of Publication
Berlin, Germany
ISBN
9783642087172
SKU
V9783642087172
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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