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X-Ray Diffraction Crystallography
Waseda, Yoshio; Matsubara, Eiichiro; Shinoda, Kozo
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Description for X-Ray Diffraction Crystallography
Paperback. X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples. Num Pages: 321 pages, biography. BIC Classification: PHFC; PNFS; TDPB; TGMT. Category: (G) General (US: Trade). Dimension: 235 x 155 x 17. Weight in Grams: 498.
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number ... Read more
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number ... Read more
Product Details
Format
Paperback
Publication date
2014
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
321
Condition
New
Number of Pages
310
Place of Publication
Berlin, Germany
ISBN
9783642442551
SKU
V9783642442551
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for X-Ray Diffraction Crystallography
From the reviews: “The authors have developed their course lecture notes into a useful book that is suitable for graduate students of materials science and engineering who use X-ray diffraction techniques. … This book is a very concise presentation of the theory of scattering and diffraction and the determination of crystal structures. … The biggest strength of this book ... Read more