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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
Ludwig Reimer
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Description for Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
Hardcover. A description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes are discussed to evaluate specific contrasts and to obtain quantitative information. Series: Springer Series in Optical Sciences. Num Pages: 543 pages, biography. BIC Classification: PDND; PHJ. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 30. Weight in Grams: 934.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Product Details
Format
Hardback
Publication date
1998
Publisher
Springer
Condition
New
Series
Springer Series in Optical Sciences
Number of Pages
529
Place of Publication
Berlin, Germany
ISBN
9783540639763
SKU
V9783540639763
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
"...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM." T Mulvey, Measurement Science and Technology. 11, No12, December 2000