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Quantitative X-ray Diffractometry
Zevin, Lev S.; Kimmel, Giora. Ed(S): Mureinik, Inez
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Description for Quantitative X-ray Diffractometry
Paperback. Editor(s): Mureinik, Inez. Num Pages: 389 pages, biography. BIC Classification: PNF. Category: (P) Professional & Vocational. Dimension: 244 x 170 x 20. Weight in Grams: 680.
One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but ... Read more
One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but ... Read more
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
389
Condition
New
Number of Pages
372
Place of Publication
New York, NY, United States
ISBN
9781461395379
SKU
V9781461395379
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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