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Secondary Ion Mass Spectrometry SIMS
. Ed(S): Benninghoven, A.; Giber, J.; Laszlo, John; Riedel, M.; Werner, H. W.
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Description for Secondary Ion Mass Spectrometry SIMS
Paperback. Editor(s): Benninghoven, A.; Giber, J.; Laszlo, John; Riedel, M.; Werner, H. W. Series: Springer Series in Chemical Physics. Num Pages: 458 pages, biography. BIC Classification: PNFS. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 24. Weight in Grams: 691.
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
458
Condition
New
Series
Springer Series in Chemical Physics
ISBN
9783642881541
SKU
V9783642881541
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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