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VLSI Design and Test
. Ed(S): Gaur, Singh Manoj; Zwolinski, Mark; Laxmi, Vijay; Boolchandani, D.; Sing, Virendra; Singh, Adit
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Description for VLSI Design and Test
Paperback. Editor(s): Gaur, Singh Manoj; Zwolinski, Mark; Laxmi, Vijay; Boolchandani, D.; Sing, Virendra; Singh, Adit. Series: Communications in Computer and Information Science. Num Pages: 404 pages, 246 black & white illustrations. BIC Classification: UKN; UYF. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 21. Weight in Grams: 617.
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
404
Condition
New
Series
Communications in Computer and Information Science
Number of Pages
388
Place of Publication
Berlin, Germany
ISBN
9783642420238
SKU
V9783642420238
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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