Fault Analysis in Cryptography
. Ed(S): Joye, Marc; Tunstall, Michael
In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industry, led to methods of hardening electronic devices designed for harsh environments. Ultimately various mechanisms for fault creation and propagation were discovered, and in particular it was noted that many cryptographic algorithms succumb to so-called fault attacks.
Preventing fault attacks without sacrificing performance is nontrivial and this is the subject of this book. Part I deals with ... Read more
This is the first book on this topic and will be of interest to researchers and practitioners engaged with cryptographic engineering.
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About . Ed(S): Joye, Marc; Tunstall, Michael
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