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Pattern Classification
Richard O. Duda
€ 190.98
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Description for Pattern Classification
Hardcover. Pattern recognition is the construction of algorithms to decode and recognize images or data patterns in so-called random data. It is a vital and growing field with applications in artifical intelligence, machine learing, data mining, speech recognition, bioinformatics, and computer vision. Num Pages: 680 pages, Ill. BIC Classification: UYAM; UYQP. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 181 x 259 x 32. Weight in Grams: 1278.
The first edition, published in 1973, has become a classic reference in the field. Now with the second edition, readers will find information on key new topics such as neural networks and statistical pattern recognition, the theory of machine learning, and the theory of invariances. Also included are worked examples, comparisons between different methods, extensive graphics, expanded exercises and computer project topics. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
The first edition, published in 1973, has become a classic reference in the field. Now with the second edition, readers will find information on key new topics such as neural networks and statistical pattern recognition, the theory of machine learning, and the theory of invariances. Also included are worked examples, comparisons between different methods, extensive graphics, expanded exercises and computer project topics. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Product Details
Publisher
John Wiley & Sons
Number of pages
680
Format
Hardback
Publication date
2000
Condition
New
Number of Pages
688
Place of Publication
New York, United States
ISBN
9780471056690
SKU
V9780471056690
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About Richard O. Duda
RICHARD O. DUDA, PhD, is Professor in the Electrical Engineering Department at San Jose State University, San Jose, California. PETER E. HART, PhD, is Chief Executive Officer and President of Ricoh Innovations, Inc. in Menlo Park, California. DAVID G. STORK, PhD, is Chief Scientist, also at Ricoh Innovations, Inc.
Reviews for Pattern Classification
...a fantastic book! The presentation...could not be better, and I recommend that future authors consider...this book as a role model. (Journal of Statistical Computation and Simulation, March 2006) ...strongly recommended both as a professional reference and as a text for students... (Technometrics, February 2002) ...provides information needed to choose the most appropriate of the many available ... Read more