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Electromigration and Electronic Device Degradation
Christou
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Description for Electromigration and Electronic Device Degradation
Hardcover. This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details. Editor(s): Christou, Aris. Num Pages: 344 pages, black & white illustrations. BIC Classification: PHK; TGPR; TJK; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (XV) Technical / Manuals. Dimension: 236 x 165 x 26. Weight in Grams: 682.
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
Product Details
Format
Hardback
Publication date
1993
Publisher
John Wiley & Sons Inc United States
Number of pages
344
Condition
New
Number of Pages
343
Place of Publication
, United States
ISBN
9780471584896
SKU
V9780471584896
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About Christou
Aris Christou is the author of Electromigration and Electronic Device Degradation, published by Wiley.
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