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Michael L. Bushnell - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing) - 9780792379911 - V9780792379911
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing)

€ 159.63
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Description for Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing) Hardcover. Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. Series: Frontiers in Electronic Testing. Num Pages: 690 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 264 x 180 x 43. Weight in Grams: 1476.
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. ... Read more

Product Details

Format
Hardback
Publication date
2004
Publisher
Springer
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
690
Place of Publication
Dordrecht, Netherlands
ISBN
9780792379911
SKU
V9780792379911
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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