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Bodade, Rajesh M.; Talbar, Sanjay - Iris Analysis for Biometric Recognition Systems - 9788132218524 - V9788132218524
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Iris Analysis for Biometric Recognition Systems

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Description for Iris Analysis for Biometric Recognition Systems Paperback. Series: SpringerBriefs in Applied Sciences and Technology/ SpringerBriefs in Computational Intelligence. Num Pages: 128 pages, 63 black & white illustrations, 19 black & white tables, biography. BIC Classification: TTBM; UYQ; UYQP. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 7. Weight in Grams: 213.
The book presents three most significant areas in Biometrics and Pattern Recognition. A step-by-step approach for design and implementation of Dual Tree Complex Wavelet Transform (DTCWT) plus Rotated Complex Wavelet Filters (RCWF) is discussed in detail. In addition to the above, the book provides detailed analysis of iris images and two methods of iris segmentation. It also discusses simplified study of some subspace-based methods and distance measures for iris recognition backed by empirical studies and statistical success verifications.

Product Details

Format
Paperback
Publication date
2014
Publisher
Springer, India, Private Ltd India
Number of pages
128
Condition
New
Series
SpringerBriefs in Applied Sciences and Technology/ SpringerBriefs in Computational Intelligence
Number of Pages
109
Place of Publication
New Delhi, India
ISBN
9788132218524
SKU
V9788132218524
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Bodade, Rajesh M.; Talbar, Sanjay
Rajesh M. Bodade is currently working as Associate Professor in Faculty of Communication Engineering at Military College of Telecommunication Engineering, Mhow, Indore, India. He completed his PhD in Electronics and Telecommunication Engineering (Iris Analysis for Biometric Recognition System) from SRTM University, Nanded, India in 2011. Dr. Bodade has more than 20 years of teaching experience. He received “Chief of Army ... Read more

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