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Chakradhar, Srimat T.; Agrawal, Vishwani D.; Bushnell, Michael L. - Neural Models and Algorithms for Digital Testing - 9780792391654 - V9780792391654
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Neural Models and Algorithms for Digital Testing

€ 131.54
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Description for Neural Models and Algorithms for Digital Testing Hardback. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 197 pages, biography. BIC Classification: T; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 12. Weight in Grams: 1030.
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . ... Read more

Product Details

Format
Hardback
Publication date
1991
Publisher
Kluwer Academic Publishers United States
Number of pages
197
Condition
New
Series
The Springer International Series in Engineering and Computer Science
Number of Pages
184
Place of Publication
Dordrecht, Netherlands
ISBN
9780792391654
SKU
V9780792391654
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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