Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Singhee, Amith; Rutenbar, Rob A.
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Description for Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Paperback. This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to parallel problems in numerous other fields. Series: Lecture Notes in Electrical Engineering. Num Pages: 210 pages, biography. BIC Classification: TJFC; UYD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 305.
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer Netherlands
Number of pages
210
Condition
New
Series
Lecture Notes in Electrical Engineering
ISBN
9789400736870
SKU
V9789400736870
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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