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Michael . Ed(S): Nicolaidis - Soft Errors in Modern Electronic Systems - 9781441969927 - V9781441969927
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Soft Errors in Modern Electronic Systems

€ 191.95
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Description for Soft Errors in Modern Electronic Systems Hardback. Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more. Editor(s): Nicolaidis, Michael. Series: Frontiers in Electronic Testing. Num Pages: 336 pages, biography. BIC Classification: TJFC; UYD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 19. Weight in Grams: 1430.

This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques.

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Product Details

Format
Hardback
Publication date
2010
Publisher
Springer-Verlag New York Inc. United States
Number of pages
336
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
318
Place of Publication
New York, NY, United States
ISBN
9781441969927
SKU
V9781441969927
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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