Stock image for illustration purposes only - book cover, edition or condition may vary.
Defect and Fault Tolerance in VLSI Systems
Israel Koren
€ 123.23
FREE Delivery in Ireland
Description for Defect and Fault Tolerance in VLSI Systems
Paperback. Num Pages: 362 pages, 96 black & white illustrations, biography. BIC Classification: UYF. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 19. Weight in Grams: 721.
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring ... Read more
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
362
Condition
New
Number of Pages
362
Place of Publication
New York, NY, United States
ISBN
9781461568018
SKU
V9781461568018
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Defect and Fault Tolerance in VLSI Systems