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Formal Equivalence Checking and Design Debugging
Huan, Shi-Yu; Cheng, Kwang-Ting
€ 232.06
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Description for Formal Equivalence Checking and Design Debugging
Hardback. Covers the topics of logic equivalence checking and design debugging in design verification. This book reviews the design problems that require logic equivalence checking and describes the underlying technologies that are used to solve them. It also gives a survey of the literature on design error diagnosis and design error correction. Series: Frontiers in Electronic Testing. Num Pages: 247 pages, biography. BIC Classification: UM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 15. Weight in Grams: 1170.
Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugging. The first part of the book reviews the design problems that require logic equivalence checking and describes the underlying technologies that are used to solve them. Some novel approaches to the problems of verifying design revisions after intensive sequential transformations such as retiming are described in detail.
The second part of the book gives a thorough survey of previous and recent literature on design error diagnosis and design error ... Read more
Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugging. The first part of the book reviews the design problems that require logic equivalence checking and describes the underlying technologies that are used to solve them. Some novel approaches to the problems of verifying design revisions after intensive sequential transformations such as retiming are described in detail.
The second part of the book gives a thorough survey of previous and recent literature on design error diagnosis and design error ... Read more
Product Details
Format
Hardback
Publication date
1998
Publisher
Kluwer Academic Publishers United States
Number of pages
247
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
229
Place of Publication
Dordrecht, Netherlands
ISBN
9780792381846
SKU
V9780792381846
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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