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Rajesh Garg - Analysis and Design of Resilient VLSI Circuits - 9781489985101 - V9781489985101
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Analysis and Design of Resilient VLSI Circuits

€ 138.85
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Description for Analysis and Design of Resilient VLSI Circuits Paperback. VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, presenting algorithms and techniques to analyze and mitigate design problems. Num Pages: 234 pages, 28 black & white tables, biography. BIC Classification: TJFC; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 13. Weight in Grams: 367.
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well ... Read more

Product Details

Format
Paperback
Publication date
2014
Publisher
Springer-Verlag New York Inc. United States
Number of pages
234
Condition
New
Number of Pages
212
Place of Publication
New York, United States
ISBN
9781489985101
SKU
V9781489985101
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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