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Cross-talk Noise Immune VLSI Design Using Regular Layout Fabrics
Brayton, Robert K.; Sangiovanni-Vincentelli, Alberto L.
€ 126.26
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Description for Cross-talk Noise Immune VLSI Design Using Regular Layout Fabrics
Paperback. Num Pages: 112 pages, biography. BIC Classification: THR; TJFC; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 7. Weight in Grams: 219.
This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending on the state of its neighboring wires. Typical approaches to tackle the cross-talk problem attempt to fix the problem once it is created. In our approach, we ensure that cross-talk is ... Read more
This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending on the state of its neighboring wires. Typical approaches to tackle the cross-talk problem attempt to fix the problem once it is created. In our approach, we ensure that cross-talk is ... Read more
Product Details
Format
Paperback
Publication date
2001
Publisher
Springer-Verlag New York Inc. United States
Number of pages
112
Condition
New
Number of Pages
112
Place of Publication
New York, NY, United States
ISBN
9781461355731
SKU
V9781461355731
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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