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IDDQ Testing of VLSI Circuits
. Ed(S): Gulati, Ravi K.; Hawkins, Charles F.
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Description for IDDQ Testing of VLSI Circuits
Paperback. Editor(s): Gulati, Ravi K.; Hawkins, Charles F. Num Pages: 124 pages, biography. BIC Classification: THR; UGC. Category: (G) General (US: Trade). Dimension: 254 x 178 x 7. Weight in Grams: 264.
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University ... Read more
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
124
Condition
New
Number of Pages
124
Place of Publication
New York, NY, United States
ISBN
9781461363774
SKU
V9781461363774
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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