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Introduction to IDDQ Testing
Chakravarty, S.; Thadikaran, Paul J.
€ 128.27
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Description for Introduction to IDDQ Testing
Paperback. Series: Frontiers in Electronic Testing. Num Pages: 342 pages, black & white illustrations, bibliography. BIC Classification: THR; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 18. Weight in Grams: 534.
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective.
A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, ... Read more
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective.
A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
342
Condition
New
Series
Frontiers in Electronic Testing
Number of Pages
323
Place of Publication
New York, NY, United States
ISBN
9781461378129
SKU
V9781461378129
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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