.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Pattern Recognition and Image Analysis
. Ed(S): Paredes, Roberto; Cardoso, Jaime S.; Pardo, Xose M.
€ 71.62
FREE Delivery in Ireland
Description for Pattern Recognition and Image Analysis
Paperback. Editor(s): Paredes, Roberto; Cardoso, Jaime S.; Pardo, Xose M. Series: Lecture Notes in Computer Science. Num Pages: 769 pages, 275 black & white illustrations, biography. BIC Classification: UYQM; UYQP; UYQV; UYS. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 39. Weight in Grams: 1163.
This book constitutes the proceedings of the 7th Iberian Conference on Pattern Recognition and Image Analysis, IbPRIA 2015, held in Santiage de Compostela, Spain, in June 2015. The 83 papers presented in this volume were carefully reviewed and selected from 141 submissions. They were organized in topical sections named: Pattern Recognition and Machine Learning; Computer Vision; Image and Signal Processing; Applications; Medical Image; Pattern Recognition and Machine Learning; Computer Vision; Image and Signal Processing; and Applications
This book constitutes the proceedings of the 7th Iberian Conference on Pattern Recognition and Image Analysis, IbPRIA 2015, held in Santiage de Compostela, Spain, in June 2015. The 83 papers presented in this volume were carefully reviewed and selected from 141 submissions. They were organized in topical sections named: Pattern Recognition and Machine Learning; Computer Vision; Image and Signal Processing; Applications; Medical Image; Pattern Recognition and Machine Learning; Computer Vision; Image and Signal Processing; and Applications
Product Details
Format
Paperback
Publication date
2015
Publisher
Springer International Publishing AG Switzerland
Number of pages
769
Condition
New
Series
Lecture Notes in Computer Science
Number of Pages
753
Place of Publication
Cham, Switzerland
ISBN
9783319193892
SKU
V9783319193892
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Pattern Recognition and Image Analysis