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. Ed(S): Dai, Honghua; Liu, James N. K.; Smirnov, Evgueni - Reliable Knowledge Discovery - 9781489995322 - V9781489995322
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Reliable Knowledge Discovery

€ 249.76
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Description for Reliable Knowledge Discovery Paperback. Editor(s): Dai, Honghua; Liu, James N. K.; Smirnov, Evgueni. Num Pages: 328 pages, 40 black & white tables, biography. BIC Classification: UML; UNF; UYQ; UYQP. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 18. Weight in Grams: 504.

Reliable Knowledge Discovery focuses on theory, methods, and techniques for RKDD, a new sub-field of KDD. It studies the theory and methods to assure the reliability and trustworthiness of discovered knowledge and to maintain the stability and consistency of knowledge discovery processes. RKDD has a broad spectrum of applications, especially in critical domains like medicine, finance, and military.

Reliable Knowledge Discovery also presents methods and techniques for designing robust knowledge-discovery processes. Approaches to assessing the reliability of the discovered knowledge are introduced. Particular attention is paid to methods for reliable feature selection, reliable graph discovery, reliable classification, and stream mining. ... Read more

Reliable Knowledge Discovery is designed for researchers and advanced-level students focused on computer science and electrical engineering as a secondary text or reference. Professionals working in this related field and KDD application developers will also find this book useful.

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Product Details

Format
Paperback
Publication date
2014
Publisher
Springer-Verlag New York Inc. United States
Number of pages
328
Condition
New
Number of Pages
310
Place of Publication
New York, United States
ISBN
9781489995322
SKU
V9781489995322
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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