.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Structural, Syntactic, and Statistical Pattern Recognition
. Ed(S): Caelli, Terry; Amin, Adnan; Duin, Robert P. W. (Delft University Of Technology, Delft, Netherlands); Kamel, Mohamed; Ridder, Dick de
€ 133.37
FREE Delivery in Ireland
Description for Structural, Syntactic, and Statistical Pattern Recognition
Paperback. Constitutes the proceedings of the 9th International Workshop on Structural and Syntactic Pattern Recognition and the 4th International Workshop on Statistical Techniques in Pattern Recognition held in Canada in 2002. Editor(s): Caelli, Terry; Amin, Adnan; Duin, Robert P. W. (Delft University of Technology, Delft, Netherlands); Kamel, Mohamed; Ridder, Dick de. Series: Lecture Notes in Computer Science. Num Pages: 898 pages, biography. BIC Classification: UYQP. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 44. Weight in Grams: 1306.
This volume contains all papers presented at SSPR 2002 and SPR 2002 hosted by the University of Windsor, Windsor, Ontario, Canada, August 6-9, 2002. This was the third time these two workshops were held back-to-back. SSPR was the ninth International Workshop on Structural and Syntactic Pattern Recognition and the SPR was the fourth International Workshop on Statis- cal Techniques in Pattern Recognition. These workshops have traditionally been held in conjunction with ICPR (International Conference on Pattern Recog- tion), and are the major events for technical committees TC2 and TC1, resp- tively, of the International Association of Pattern Recognition (IAPR). The ... Read more
This volume contains all papers presented at SSPR 2002 and SPR 2002 hosted by the University of Windsor, Windsor, Ontario, Canada, August 6-9, 2002. This was the third time these two workshops were held back-to-back. SSPR was the ninth International Workshop on Structural and Syntactic Pattern Recognition and the SPR was the fourth International Workshop on Statis- cal Techniques in Pattern Recognition. These workshops have traditionally been held in conjunction with ICPR (International Conference on Pattern Recog- tion), and are the major events for technical committees TC2 and TC1, resp- tively, of the International Association of Pattern Recognition (IAPR). The ... Read more
Product Details
Format
Paperback
Publication date
2002
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
898
Condition
New
Series
Lecture Notes in Computer Science
Number of Pages
866
Place of Publication
Berlin, Germany
ISBN
9783540440116
SKU
V9783540440116
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Structural, Syntactic, and Statistical Pattern Recognition