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Advances in X-ray Analysis
. Ed(S): Barrett, Charles S.; Gilfrich, John V.; Huang, Ting C.; Jenkins, Ron; McCarthy, G. J.; Predecki, Paul K.; Ryon, R.; Smith, Deane K.
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Description for Advances in X-ray Analysis
Paperback. Editor(s): Barrett, Charles S.; Gilfrich, John V.; Huang, Ting C.; Jenkins, Ron; McCarthy, G. J.; Predecki, Paul K.; Ryon, R.; Smith, Deane K. Num Pages: 641 pages, biography. BIC Classification: PNF; TGM; THR. Category: (P) Professional & Vocational. Dimension: 244 x 170 x 33. Weight in Grams: 1099.
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
641
Condition
New
Number of Pages
641
Place of Publication
New York, NY, United States
ISBN
9781461365327
SKU
V9781461365327
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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