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Microscopic Aspects of Nonlinearity in Condensed Matter
. Ed(S): Bishop, Alan R.; Pokrovsky, V. L.; Tognetti, V.
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Description for Microscopic Aspects of Nonlinearity in Condensed Matter
Paperback. Proceedings of a NATO ARW held in Florence, Italy, June 7--13, 1990 Editor(s): Bishop, Alan R.; Pokrovsky, V. L.; Tognetti, V. Series: NATO Science Series B. Num Pages: 374 pages, biography. BIC Classification: PHFC; PNFS; WM. Category: (G) General (US: Trade). Dimension: 254 x 178 x 19. Weight in Grams: 714.
The collection of articles in this volume represents the proceedings of the inau- gural Conference of the Institute of Theoretical Matter Physics at the University of Florence, Italy, June 7-13, 1990. The aim of this Institute (sponsored by the Con- sorzio Interuniversitario di Fisica della Materia, INFM) is to foster interdisciplinary approaches to theoretical problems in Solid State, Electronics and Optics. Corre- spondingly, the Conference surveyed a broad scope of modern analytic techniques in nonlinear science and their application to novel liquids, solids and optical environ- ments. The Conference was held at Centro Studi CISL, a magnificent Villa up to ... Read more
The collection of articles in this volume represents the proceedings of the inau- gural Conference of the Institute of Theoretical Matter Physics at the University of Florence, Italy, June 7-13, 1990. The aim of this Institute (sponsored by the Con- sorzio Interuniversitario di Fisica della Materia, INFM) is to foster interdisciplinary approaches to theoretical problems in Solid State, Electronics and Optics. Corre- spondingly, the Conference surveyed a broad scope of modern analytic techniques in nonlinear science and their application to novel liquids, solids and optical environ- ments. The Conference was held at Centro Studi CISL, a magnificent Villa up to ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
374
Condition
New
Series
NATO Science Series B
Number of Pages
374
Place of Publication
New York, NY, United States
ISBN
9781468459630
SKU
V9781468459630
Shipping Time
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Ref
99-15
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