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Point and Extended Defects in Semiconductors
Giorgio . Ed(S): Benedek
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Description for Point and Extended Defects in Semiconductors
Paperback. Editor(s): Benedek, Giorgio. Series: NATO Science Series B. Num Pages: 297 pages, black & white illustrations. BIC Classification: PHFC; PNFS. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 15. Weight in Grams: 574.
The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char acterization of defects, their role in determining transport and optical properties of semiconductor materials and devices, as well as from the technology of the ever in creasing scale of integration. This book presents to the reader a view into both basic concepts of defect physics and recent ... Read more
The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char acterization of defects, their role in determining transport and optical properties of semiconductor materials and devices, as well as from the technology of the ever in creasing scale of integration. This book presents to the reader a view into both basic concepts of defect physics and recent ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
297
Condition
New
Series
NATO Science Series B
Number of Pages
287
Place of Publication
New York, NY, United States
ISBN
9781468457117
SKU
V9781468457117
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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