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Mauro . Ed(S): Sardela - Practical Materials Characterization - 9781493942985 - V9781493942985
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Practical Materials Characterization

€ 139.21
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Description for Practical Materials Characterization paperback. Covering the most common materials analysis techniques, this book reviews microstructural, surface, morphological and optical characterization of materials with emphasis on microscopic structural, electronic, biological and mechanical properties. Editor(s): Sardela, Mauro. Num Pages: 244 pages, 26 black & white illustrations, 92 colour illustrations, 10 black & white tables, biograp. BIC Classification: PNFS; TGMT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 13. Weight in Grams: 385.
Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

Product Details

Format
Paperback
Publication date
2016
Publisher
Springer United States
Number of pages
244
Condition
New
Number of Pages
237
Place of Publication
New York, United States
ISBN
9781493942985
SKU
V9781493942985
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Mauro . Ed(S): Sardela
Mauro Sardela (editor) is a Senior Research Scientist and Manager of the X-Ray Analysis Laboratory at the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign. Dr. Sardela received his PhD in Material Science, in 1994, from the Institute of Physics of Materials, Linköping University, Sweden. He has authored and co-authored several publications in the area of x-ray scattering, ... Read more

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