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. Ed(S): Benninghoven, A.; Giber, J.; Laszlo, John; Riedel, M.; Werner, H. W. - Secondary Ion Mass Spectrometry SIMS - 9783642881541 - V9783642881541
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Secondary Ion Mass Spectrometry SIMS

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Description for Secondary Ion Mass Spectrometry SIMS Paperback. Editor(s): Benninghoven, A.; Giber, J.; Laszlo, John; Riedel, M.; Werner, H. W. Series: Springer Series in Chemical Physics. Num Pages: 458 pages, biography. BIC Classification: PNFS. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 24. Weight in Grams: 691.
Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the ... Read more

Product Details

Format
Paperback
Publication date
2012
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
458
Condition
New
Series
Springer Series in Chemical Physics
Number of Pages
447
Place of Publication
Berlin, Germany
ISBN
9783642881541
SKU
V9783642881541
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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