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. Ed(S): Benninghoven, Alfred; Colton, Richard J.; Simons, David S.; Werner, Helmut W. - Secondary Ion Mass Spectrometry SIMS - 9783642827266 - V9783642827266
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Secondary Ion Mass Spectrometry SIMS

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Description for Secondary Ion Mass Spectrometry SIMS Paperback. Editor(s): Benninghoven, Alfred; Colton, Richard J.; Simons, David S.; Werner, Helmut W. Series: Springer Series in Chemical Physics. Num Pages: 586 pages, biography. BIC Classification: PNFC; PNFS; PNR. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 30. Weight in Grams: 883.
This volume contains the proceedings of the Fifth International Confer- ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni- ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R. J. Colton of the Nayal Research Lab- oratory and Dr. D. S. Simons of the National Bureau of Standards un- der the auspices of the International Organizing Committee chaired by Prof. A. ... Read more

Product Details

Format
Paperback
Publication date
2012
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
586
Condition
New
Series
Springer Series in Chemical Physics
Number of Pages
564
Place of Publication
Berlin, Germany
ISBN
9783642827266
SKU
V9783642827266
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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