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. Ed(S): Benninghoven, A.; Okano, J.; Shimizu, R.; Werner, H. W. - Secondary Ion Mass Spectrometry SIMS IV - 9783642822582 - V9783642822582
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Secondary Ion Mass Spectrometry SIMS IV

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Description for Secondary Ion Mass Spectrometry SIMS IV Paperback. Editor(s): Benninghoven, A.; Okano, J.; Shimizu, R.; Werner, H. W. Series: Springer Series in Chemical Physics. Num Pages: 522 pages, black & white illustrations, bibliography. BIC Classification: PNFS; PNR. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 27. Weight in Grams: 801.
This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or­ ganizing committee under the auspices of the international organizing com­ mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rap­ idly expanding activities in the SIMS field, informative papers were pre­ sented containing up-to-date information on SIMS and various ... Read more

Product Details

Format
Paperback
Publication date
2012
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
522
Condition
New
Series
Springer Series in Chemical Physics
Number of Pages
506
Place of Publication
Berlin, Germany
ISBN
9783642822582
SKU
V9783642822582
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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