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Coincidence Studies of Electron and Photon Impact Ionization
. Ed(S): Whelan, C. T.; Walters, H. R. J.
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Description for Coincidence Studies of Electron and Photon Impact Ionization
Paperback. Proceedings of a European conference held in Belfast, Northern Ireland, September 5-7, 1996 Editor(s): Whelan, C. T.; Walters, H. R. J. Series: Physics of Atoms and Molecules. Num Pages: 332 pages, biography. BIC Classification: PHF; PHFC; PHM; PHU; PNFS. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 18. Weight in Grams: 640.
The great advantage of coincidence measurements is that by suitable choice of the kinematical and geometrical arrangement one may probe delicate physical effects which would be swamped in less differential experiments. The measurement of the triple dif ferential and higher-order cross sections presents enormous technical difficulties, but refined experiments of this type provide an insight into the subtleties of the scattering process and offer a welcome, if severe, test of the available theoretical models. The last few years have been an exciting time to work in the field and much has been learned. Profound insights have been gleaned into the ... Read more
The great advantage of coincidence measurements is that by suitable choice of the kinematical and geometrical arrangement one may probe delicate physical effects which would be swamped in less differential experiments. The measurement of the triple dif ferential and higher-order cross sections presents enormous technical difficulties, but refined experiments of this type provide an insight into the subtleties of the scattering process and offer a welcome, if severe, test of the available theoretical models. The last few years have been an exciting time to work in the field and much has been learned. Profound insights have been gleaned into the ... Read more
Product Details
Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
332
Condition
New
Series
Physics of Atoms and Molecules
Number of Pages
322
Place of Publication
New York, NY, United States
ISBN
9781475797534
SKU
V9781475797534
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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