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Kaushik, Brajesh Kumar; Majumder, Manoj Kumar - Carbon Nanotube Based Vlsi Interconnects - 9788132220466 - V9788132220466
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Carbon Nanotube Based Vlsi Interconnects

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Description for Carbon Nanotube Based Vlsi Interconnects Paperback. Series: SpringerBriefs in Applied Sciences and Technology. Num Pages: 97 pages, 57 black & white illustrations, 9 black & white tables, biography. BIC Classification: TDPB; TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 5. Weight in Grams: 168.
The brief primarily focuses on the performance analysis of CNT based interconnects in current research scenario. Different CNT structures are modeled on the basis of transmission line theory. Performance comparison for different CNT structures illustrates that CNTs are more promising than Cu or other materials used in global VLSI interconnects. The brief is organized into five chapters which mainly discuss: (1) an overview of current research scenario and basics of interconnects; (2) unique crystal structures and the basics of physical properties of CNTs, and the production, purification and applications of CNTs; (3) a brief technical review, the geometry and equivalent ... Read more

Product Details

Format
Paperback
Publication date
2014
Publisher
Springer, India, Private Ltd India
Number of pages
97
Condition
New
Series
SpringerBriefs in Applied Sciences and Technology
Number of Pages
86
Place of Publication
New Delhi, India
ISBN
9788132220466
SKU
V9788132220466
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Kaushik, Brajesh Kumar; Majumder, Manoj Kumar
Brajesh Kumar Kaushik is currently working as Associate Professor in Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, India. Dr. Kaushik has completed his PhD from Indian Institute of Technology Roorkee in 2007. His research interests include Signal Integrity, Propagation Delay, and Power Dissipation of VLSI Interconnects; Low Power VLSI Design; Electronic Design Automation (EDA)-Circuit and ... Read more

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