.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Metrology and Physical Mechanisms in New Generation Ionic Devices
Umberto Celano
€ 127.76
FREE Delivery in Ireland
Description for Metrology and Physical Mechanisms in New Generation Ionic Devices
Hardback. Series: Springer Theses. Num Pages: 199 pages, 78 black & white illustrations, 18 colour illustrations, biography. BIC Classification: PNFS; TDPB; TGMT. Category: (G) General (US: Trade). Dimension: 235 x 155 x 13. Weight in Grams: 467.
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
Product Details
Publisher
Springer International Publishing AG
Format
Hardback
Publication date
2016
Series
Springer Theses
Condition
New
Weight
466g
Number of Pages
175
Place of Publication
Cham, Switzerland
ISBN
9783319395302
SKU
V9783319395302
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Umberto Celano
Umberto Celano received a M.Sc. degree in Nanoelectronics from the University of Rome ``Sapienza'', Italy and a Ph.D. degree in Physics from the KU Leuven, Belgium in 2011 and 2015 respectively. Currently, he is a researcher in the material and component analysis group of imec in Belgium. Umberto's research interests include nanometer scale issues in materials, emerging nanoelectronics and physical ... Read more
Reviews for Metrology and Physical Mechanisms in New Generation Ionic Devices