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Progress in Transmission Electron Microscopy
Xiao-Feng Zhang
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Description for Progress in Transmission Electron Microscopy
Paperback. Series: Springer Series in Surface Sciences. Num Pages: 321 pages, 5 black & white tables, biography. BIC Classification: PDDM; TBN; TDCK; TGMT. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 17. Weight in Grams: 497.
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Product Details
Format
Paperback
Publication date
2010
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
321
Condition
New
Series
Springer Series in Surface Sciences
Number of Pages
307
Place of Publication
Berlin, Germany
ISBN
9783642087189
SKU
V9783642087189
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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