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Michael Steger - Transition-Metal Defects in Silicon - 9783642438080 - V9783642438080
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Transition-Metal Defects in Silicon

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Description for Transition-Metal Defects in Silicon Paperback. This book demonstrates the power of isotopic enrichment for high-resolution spectroscopic characterization. It records properties of transition metal centers in silicon with unprecedented accuracy. Series: Springer Theses. Num Pages: 109 pages, 17 black & white illustrations, 18 colour illustrations, biography. BIC Classification: PNFS; TDM; TGMT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 6. Weight in Grams: 186.
The fundamental properties of deep luminescence centres in Si associated with transition metals such as Cu, Ag, Au, and Pt have been a focus of interest for decades, both as markers for these deleterious contaminants, and also in the quest for efficient Si-based light emission.
 
This dissertation presents the results of ultra-high resolution photoluminescence studies of these centres in specially prepared, highly enriched 28-Si samples. The greatly improved spectral resolution due to this enrichment led to the discovery of isotopic fingerprints. These fingerprints have revealed that the detailed constituents of all of the centres previously studied had ... Read more

Product Details

Format
Paperback
Publication date
2013
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
109
Condition
New
Series
Springer Theses
Number of Pages
97
Place of Publication
Berlin, Germany
ISBN
9783642438080
SKU
V9783642438080
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Michael Steger
Department of Physics Simon Fraser University Burnaby, BC V5A 1S6 Canada

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