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Computed Tomography Principles, Design, Artifacts, and Recent Advances
Jiang Hsieh
€ 145.81
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Description for Computed Tomography Principles, Design, Artifacts, and Recent Advances
Hardcover. Six years after its first edition, Computed Tomography: Principles, Design, Artifacts, and Recent Advances, Second Edition provides and updated overview of the evolution of CT, the mathematical and physical aspects of the technology, and the fundamentals of image reconstruction algorithms. Num Pages: 510 pages, black & white illustrations, black & white tables, figures. BIC Classification: MJ; TCB; TJ. Category: (P) Professional & Vocational. Dimension: 260 x 178 x 40. Weight in Grams: 1344.
Six years after its first edition, Computed Tomography: Principles, Design, Artifacts, and Recent Advances, Second Edition provides and updated overview of the evolution of CT, the mathematical and physical aspects of the technology, and the fundamentals of image reconstruction algorithms. Given the high visibility and public awareness of the impact of x-ray radiation, the second edition features a new chapter on x-ray dose and presents different dose reduction techniques ranging from patient handling, optimal data acquisition, image reconstruction, and postprocess. Based on the advancements over the past six years, the second edition includes new sections on cone beam reconstruction algorithms, ... Read more
Six years after its first edition, Computed Tomography: Principles, Design, Artifacts, and Recent Advances, Second Edition provides and updated overview of the evolution of CT, the mathematical and physical aspects of the technology, and the fundamentals of image reconstruction algorithms. Given the high visibility and public awareness of the impact of x-ray radiation, the second edition features a new chapter on x-ray dose and presents different dose reduction techniques ranging from patient handling, optimal data acquisition, image reconstruction, and postprocess. Based on the advancements over the past six years, the second edition includes new sections on cone beam reconstruction algorithms, ... Read more
Product Details
Format
Hardback
Publication date
2009
Publisher
John Wiley & Sons Inc United Kingdom
Number of pages
510
Condition
New
Number of Pages
574
Place of Publication
New York, United States
ISBN
9780470563533
SKU
V9780470563533
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About Jiang Hsieh
Jiang Hsieh is a Chief Scientist in the Applied Science Laboratory of GE Healthcare Technologies and an adjunct Professor in the Medical Physics Department of the University of Wisconsin, Madison. He has more than 20 years of experience in medical imaging. He holds over 100 US patents, has coauthored more than 100 articles, book chapters, and textbook.
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