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Spatial Statistics for Remote Sensing
. Ed(S): Stein, Alfred; Meer, Freek D. Van Der; Gorte, Ben
€ 181.45
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Description for Spatial Statistics for Remote Sensing
Paperback. This title treats statistical issues that are of relevance in spatial studies for remote sensing. It consists of contributions by international experts in this field. A brief overview of basic statistics is given, followed by physical aspects of the topic. Editor(s): Stein, Alfred; Meer, Freek D. van der; Gorte, Ben. Series: Remote Sensing and Digital Image Processing. Num Pages: 300 pages, 58 black & white illustrations. BIC Classification: RGW. Category: (P) Professional & Scholarly; (UP) Postgraduate; (UU) Undergraduate. Dimension: 235 x 155 x 16. Weight in Grams: 547.
This book is a collection of papers on spatial statistics for remote sensing. The book emerges from a study day that was organized in 1996 at the International Institute for Aerospace Survey and Earth Sciences, ITC, in Enschede, The Netherlands. It was by several means a memorable event. The beautiful new building, according to a design by the famous modern Dutch architect Max van Huet was just opened, and this workshop was the first to take place there. Of course, much went wrong during the workshop, in particular as the newest electronic equipment regularly failed. But the workshop attrackted more ... Read more
This book is a collection of papers on spatial statistics for remote sensing. The book emerges from a study day that was organized in 1996 at the International Institute for Aerospace Survey and Earth Sciences, ITC, in Enschede, The Netherlands. It was by several means a memorable event. The beautiful new building, according to a design by the famous modern Dutch architect Max van Huet was just opened, and this workshop was the first to take place there. Of course, much went wrong during the workshop, in particular as the newest electronic equipment regularly failed. But the workshop attrackted more ... Read more
Product Details
Format
Paperback
Publication date
2002
Publisher
Kluwer Academic Publishers United States
Number of pages
300
Condition
New
Series
Remote Sensing and Digital Image Processing
Number of Pages
284
Place of Publication
New York, NY, United States
ISBN
9781402005510
SKU
V9781402005510
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Spatial Statistics for Remote Sensing
"...constitutes a nice synopsis of an extensive array of topics and ideas. ...as a reference source, it is definitely worth having access to, and it would be an appropriate addition for most research libraries. ...it does represent a contribution to the literature that individuals involved in remote sensing data analysis should like to have at their disposal, and so libraries ... Read more