Foundations of Incidence Geometry
Johannes Ueberberg
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Description for Foundations of Incidence Geometry
Hardback. This book offers a clear and comprehensible introduction to incidence geometry, including such topics as projective and affine geometry and the theory of buildings and polar spaces. More than 200 figures make even complicated proofs accessible to the reader. Series: Springer Monographs in Mathematics. Num Pages: 260 pages, biography. BIC Classification: PBM. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 15. Weight in Grams: 545.
Incidence geometry is a central part of modern mathematics that has an impressive tradition. The main topics of incidence geometry are projective and affine geometry and, in more recent times, the theory of buildings and polar spaces.
Embedded into the modern view of diagram geometry, projective and affine geometry including the fundamental theorems, polar geometry including the Theorem of Buekenhout-Shult and the classification of quadratic sets are presented in this volume. Incidence geometry is developed along the lines of the fascinating work of Jacques Tits and Francis Buekenhout.
The book is a clear and comprehensible introduction into a wonderful piece of mathematics. More ... Read more
Show LessProduct Details
Format
Hardback
Publication date
2011
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
260
Condition
New
Series
Springer Monographs in Mathematics
Number of Pages
248
Place of Publication
Berlin, Germany
ISBN
9783642209710
SKU
V9783642209710
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Foundations of Incidence Geometry
“This book provides an introduction into projective and affine spaces as well as polar spaces in the modern language of diagram geometry. … The book is well written and contains many enlightning pictures. It is mainly directed to students.” (Hans Cuypers, Nieuw Archief voor Wiskunde, Issue 4, December, 2015) “The book under review is a comprehensive monograph devoted to ... Read more