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Pei Zhang - Beam Diagnostics in Superconducting Accelerating Cavities - 9783319007588 - V9783319007588
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Beam Diagnostics in Superconducting Accelerating Cavities

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Description for Beam Diagnostics in Superconducting Accelerating Cavities Hardback. This book provides a detailed survey of various dimension reduction methods applicable for rf diagnostics. It is an ideal resource for students new to the field as well as for scientists well-versed in rf diagnostics. Series: Springer Theses. Num Pages: 130 pages, 140 black & white illustrations, 40 colour illustrations, biography. BIC Classification: PHJ; PHP; PHU. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 13. Weight in Grams: 368.
An energetic charged particle beam introduced to an rf cavity excites a wakefield therein. This wakefield can be decomposed into a series of higher order modes and multipoles, which for sufficiently small beam offsets are dominated by the dipole component. This work focuses on using these dipole modes to detect the beam position in third harmonic superconducting S-band cavities for light source applications. A rigorous examination of several means of analysing the beam position based on signals radiated to higher order modes ports is presented. Experimental results indicate a position resolution, based on this technique, of 20 microns over a ... Read more

Product Details

Format
Hardback
Publication date
2013
Publisher
Springer International Publishing AG Switzerland
Number of pages
130
Condition
New
Series
Springer Theses
Number of Pages
118
Place of Publication
Cham, Switzerland
ISBN
9783319007588
SKU
V9783319007588
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Pei Zhang
The author read physics at the University of Science and Technology of China (USTC) in Hefei from 2002 to 2006. After graduating with a BSc in applied physics, he worked at CERN in Geneva for one year as a visiting scholar employed by the University of Michigan (Ann Arbor). In 2009, he was awarded a MSc in Particle Physics from ... Read more

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