.png){kind=logo}
Stock image for illustration purposes only - book cover, edition or condition may vary.
Evaluation of Advanced Semiconductor Materials by Electron Microscopy
David . Ed(S): Cherns
€ 68.83
FREE Delivery in Ireland
Description for Evaluation of Advanced Semiconductor Materials by Electron Microscopy
Paperback. Editor(s): Cherns, David. Series: NATO Science Series B. Num Pages: 412 pages, biography. BIC Classification: MBGR. Category: (G) General (US: Trade). Dimension: 244 x 170 x 22. Weight in Grams: 733.
The last few years have ~een rapid improvements in semiconductor growth techniques which have produced an expanding range of high quality heterostructures for new semiconductor devises. As the dimensions of such structures approach the nanometer level, it becomes increasingly important to characterise materials properties such as composition uniformity, strain, interface sharpness and roughness and the nature of defects, as well as their influence on electrical and optical properties. Much of this information is being obtained by electron microscopy and this is also an area of rapid progress. There have been advances for thin film studies across a wide range of ... Read more
The last few years have ~een rapid improvements in semiconductor growth techniques which have produced an expanding range of high quality heterostructures for new semiconductor devises. As the dimensions of such structures approach the nanometer level, it becomes increasingly important to characterise materials properties such as composition uniformity, strain, interface sharpness and roughness and the nature of defects, as well as their influence on electrical and optical properties. Much of this information is being obtained by electron microscopy and this is also an area of rapid progress. There have been advances for thin film studies across a wide range of ... Read more
Product Details
Format
Paperback
Publication date
2011
Publisher
Springer-Verlag New York Inc. United States
Number of pages
412
Condition
New
Series
NATO Science Series B
Number of Pages
412
Place of Publication
New York, NY, United States
ISBN
9781461278504
SKU
V9781461278504
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Evaluation of Advanced Semiconductor Materials by Electron Microscopy
From Book News, Inc. These proceedings comprise papers reviewing technical progress as well as applications in the areas of: electron microscopy; electron diffraction; energy loss microanalysis; cathodoluminescence; Schottky Barriers; interfaces; analysis of local strains; surface microscopy; and defects in heteroepitaxy. Annotation copyright Book News, Inc. Portland, Or.