Near-field Nano/Atom Optics and Technology
Motoichi . Ed(S): Ohtsu
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Description for Near-field Nano/Atom Optics and Technology
Hardback. This volume provides the most advanced and instructive information of near-field nano/atom optics and technology to graduate students. On the other hand, as it presents very new ideas and approaches, it should also be useful for researchers interested in applying new technology to their research as well as those students. Editor(s): Ohtsu, Motoichi. Num Pages: 316 pages, biography. BIC Classification: PHJ; TBN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 19. Weight in Grams: 625.
Intrinsic features of the optical near field open a new frontier in optical science and technology by finally overcoming the diffraction limit to reach nanometric dimensions. But this book goes beyond near-field optical microscopy to cover local spectroscopy, nanoscale optical processing and storage, quantum near-field optics, and atom manipulation. Near-Field Nano/Atom Optics and Technology provides the first complete and systematically compiled account of the science and technology required to generate the near field, and features applications including imaging of biological specimens and diagnostics for semiconductor nanomaterials and devices. This monograph will be invaluable to researchers who want to implement near-field ... Read more
Intrinsic features of the optical near field open a new frontier in optical science and technology by finally overcoming the diffraction limit to reach nanometric dimensions. But this book goes beyond near-field optical microscopy to cover local spectroscopy, nanoscale optical processing and storage, quantum near-field optics, and atom manipulation. Near-Field Nano/Atom Optics and Technology provides the first complete and systematically compiled account of the science and technology required to generate the near field, and features applications including imaging of biological specimens and diagnostics for semiconductor nanomaterials and devices. This monograph will be invaluable to researchers who want to implement near-field ... Read more
Product Details
Format
Hardback
Publication date
1998
Publisher
Springer Verlag, Japan Japan
Number of pages
316
Condition
New
Number of Pages
302
Place of Publication
Tokyo, Japan
ISBN
9784431702283
SKU
V9784431702283
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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