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Benediktovich, Andrey; Feranchuk, Ilya D. (Belarus University); Ulyanenkov, Alexander P. (Bruker Axs Gmbh) - Theoretical Concepts of X-Ray Nanoscale Analysis - 9783642381768 - V9783642381768
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Theoretical Concepts of X-Ray Nanoscale Analysis

€ 184.38
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Description for Theoretical Concepts of X-Ray Nanoscale Analysis Hardback. Theoretical Concepts of X-Ray Nanoscale Analysis Series: Springer Series in Materials Science. Num Pages: 331 pages, 71 black & white illustrations, 37 colour illustrations, biography. BIC Classification: PHP; PNFS. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 23. Weight in Grams: 660.
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals ... Read more

Product Details

Format
Hardback
Publication date
2013
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
331
Condition
New
Series
Springer Series in Materials Science
Number of Pages
318
Place of Publication
Berlin, Germany
ISBN
9783642381768
SKU
V9783642381768
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

About Benediktovich, Andrey; Feranchuk, Ilya D. (Belarus University); Ulyanenkov, Alexander P. (Bruker Axs Gmbh)
Andrey Benediktovich is working at the department of Theoretical Physics, Belarusian State University, Minsk, Belarus. Since several years he takes a part in joint projects with Bruker AXS, which are dedicated to the development of modern analytical methods for X-ray data analysis. He also collaborates with Siegen University (Germany) for theoretical simulation of the X-ray diffraction processes occured at X-ray ... Read more

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