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Advances in X-Ray Analysis
Mallett, Gavin R.; Fay, Marie; Mueller, William M.
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Description for Advances in X-Ray Analysis
Paperback. Num Pages: 553 pages, 194 black & white illustrations, 12 colour illustrations, biography. BIC Classification: PNR. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 29. Weight in Grams: 1053.
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to ... Read more
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to ... Read more
Product Details
Format
Paperback
Publication date
2012
Publisher
Springer-Verlag New York Inc. United States
Number of pages
553
Condition
New
Number of Pages
544
Place of Publication
New York, NY, United States
ISBN
9781468476354
SKU
V9781468476354
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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